Joint Research Group - SyncLab

X-ray fluorescence spectroscopy

Elemental analysis

X-ray fluorescence spectroscopy is a wide-spread tool for the qualitative and quantitative elemental analysis of materials. While the fundamental equations governing the emission of fluorescence after excitation with X-rays were developed in the 1960, quantification is still not routinely performed. We develop instrumentation and quantification procedures and use both X-ray tube spectrometers as well as setups at synchrotron radiation facilities.

2D X-ray fluorescence imaging

By scanning a heterogeneous sample through a focussed X-ray beam and collecting the characteristic X-ray fluorescence, elemental imaging is rendered feasible. The technique enables minimally-destrcutive investigations of materials without the prerequisite of an elaborate sample preparation.  In the laboratory, typically micro-XRF instruments with lateral resolutions of 10 µm to 60 µm are available. At the synchrotron nano-XRF setups are increasingly accesible.

As all processes governing the emission of a characteristic X-ray photon are well understood and the cross section tabulated, quantification is facilitated opening the way to materials metrology and absolute concentration determination.

3D X-ray fluorescence imaging

Confocal micro-XRF spectroscopy utilized a second optic in front of the energy-dispersive detector. A micron-sized probing volume is formed from which in first approximation all information is derived. In this way, 3D imaging can be performed.

We develop both adapted setups as well and analytical procedures to render confocal micro-XRF into a true analytical tool for quantitative elemental 3D imaging.